University of Liège

The equipment of the CAREM is composed of three atomic force microscopes, one environmental scanning electron microscope fully equipped (secondary and backscattered electron imaging, elemental detection, backscattered electron diffraction, Peltier cooling stage), one scanning electron microscope equipped with ultra high speed elementary mapping, one scanning electron microscope coupled with an electron beam lithography system, one conventional scanning electron microscope, one scanning and transmission electron microscope equipped with a cryo-transfert, elemental detection and tomography suite as well as two confocal laser microscopes.

Three Atomic Force Microscopes (AFM), offering several imaging modes (magnetic force, frictional force, phase contrast, force-volume, molecular recognition imaging, …), force spectroscopy mode, and possibility of controlled environment (gas, liquid) and temperature.

We offer expertise in:

  • Classical and advanced surface characterization:
    Topography, mechanical properties, adhesion, chemical imaging with functionalized probes

  • Cutting edge research areas:

PicoPlus AFM/STM 5500

Manufacturer: Agilent Technologies
Molecular recognition and molecular manipulation, fabrication of stimuli-responsive probes, single molecule deposition, single molecule actuators and machines using AFM cantilevers as mechanical sensors,…

Multimode SPM

Manufacturer: Veeco
Classical modes + Pico force mode (z closed-loop scanner) and Pico angler for a broader range of possibilities in force measurements

Dimension 3100

Manufacturer: Veeco
Sample size convenience and flexibility

Manufacturer: FEI
Year: 2000
Funding: FEDER, Region Wallonne
Model: ESEM XL 30
Options: EDS, SE, BSE, EBSD, Peltier stage, environmental mode Description:

The Field Emission Environmental SEM Philips XL30 is a unique instrument in which specimens can be examined with a field emission source electron beam in a high chamber pressure environment.  It combines: 
  • Very high resolution/magnification and excellent signal to noise ratio in both regular high vacuum and environmental (Wet) mode due to field-emission electron source.
  • Real “Wet” mode (100% humidity in the specimen chamber) and the possibility to examine specimens with pressure in the chamber up to 10 Torr .
  • Elemental detection, including mapping (EDS).
  • Mapping of crystal orientation on polished sections (EBSD).

Almost any specimen of suitable size can be examined in this microscope without destruction and additional specimen preparation procedures.


Manufacturer: ZEISS
Year: 2016
Model: SIGMA 300
Options: Ultra high speed elementary mapping - 2 EDS 30 mm² - µ-XRF


Manufacturer: FEI
Year: 2004
Model: QUANTA 600
Options: SE, BSE, EDS
Conventional SEM (W gun)


Manufacturer: RAITH
Year: 2016

SE mode (E-T + in-lens) < 20kV
Probe current: 5pA - 20nA
Beam energy: 0,1-30 kV
Patterning with high resolution electronic beam
Writing resolution: 10 nm


Manufacturer: FEI ( ex-Philips)
Year: 2006
Funding: FNRS, ULg
Model: Tecnai G2 TWIN
Options: STEM, EDS, HAADF, CRYO, TOMO, ion miller, digital camera 2kx2k


200 kV LaB6 TEM and STEM for biological samples and material sciences
Elemental detection in every configuration, possibility of mapping
Cryo-stage and cryo-transfert of frozen samples
3D reconstruction of objects in thick layers (~200nm) by Electron Tomography
Electron diffraction for crystal structure investigation
Sample preparation lab (ultracryomicrotomy, ion-milling,...)


Manufacturer: LEICA
Year: 2000
Model: SP2
Options: 3 fluorescence detectors (1 transmitted light detector) - 3 lasers (visible light) - molecular dynamics


Manufacturer: LEICA
Model: SP5 II
Options: 5 fluorescence detectors (1 transmitted light detector) - 6 lasers for UV, visible and IR excitation (multiphoton)